[PDF.53xd] Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

[PDF.mv46] Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)

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 | #7404197 in Books |  Manoj Sachdev Jos |  2007-06-21 | Original language:English | PDF # 1 |  9.21 x.81 x6.14l,1.59 | File type: PDF | 328 pages

 | Defect Oriented Testing for Nano Metric CMOS VLSI Circuits

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||From the Back Cover||Failures of nano-metric technologies owing to defects and shrinking process tolerances give rise to significant challenges for IC testing. As the variation of fundamental parameters such as channel length, threshold voltage, thin oxide thick

The 2^nd edition of defect oriented testing has been extensively updated. New chapters on Functional, Parametric Defect Models and Inductive fault Analysis and Yield Engineering have been added to provide a link between defect sources and yield. The chapter on RAM testing has been updated with focus on parametric and SRAM stability testing. Similarly, newer material has been incorporated in digital fault modeling and analog testing chapters. The strength of ...

You easily download any file type for your device.Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits (Frontiers in Electronic Testing)   |  Manoj Sachdev, José Pineda de Gyvez. I really enjoyed this book and have already told so many people about it!

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