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Fundamentals of Modern VLSI Devices
Yuan Taur, Tak H. Ning
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| #846083 in Books | Cambridge University Press | 2013-06-24 | 2013-05-02 | Original language:English | PDF # 1 | 9.72 x1.22 x6.85l,2.55 | File type: PDF | 678 pages | ||10 of 11 people found the following review helpful.| Taur/Ning (IBM) - Fundamentals of Modern VLSI Devices|By Constantin Bulucea|This is the best book currently available on device electronics. Written by renown contributors to the field from IBM, it takes the complexity of integrated semiconductor devices down to its first-order, industry-proven essentials. In this respect, "Fundamentals of Modern VLSI Devices" comes in line w||"For the past several years, I've taught from Taur and Ning's book because it's best at connecting advanced device physics to real world device, circuit, and system technology. The second edition updates each chapter, adds new chapters on memory and SOI, doubl
Learn the basic properties and designs of modern VLSI devices, as well as the factors affecting performance, with this thoroughly updated second edition. The first edition has been widely adopted as a standard textbook in microelectronics in many major US universities and worldwide. The internationally renowned authors highlight the intricate interdependencies and subtle trade-offs between various practically important device parameters, and provide an in-depth discussio...
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