[PDF.69cr] Integrated Circuit Defect-Sensitivity: Theory and Computational Models (The Springer International Series in Engineering and Computer Science)

Integrated Circuit Defect-Sensitivity: Theory and Computational Models (The Springer International Series in Engineering and Computer Science)

[PDF.gp82] Integrated Circuit Defect-Sensitivity: Theory and Computational Models (The Springer International Series in Engineering and Computer Science)

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 | #9501179 in Books |  Springer |  1992-12-31 | Original language:English | PDF # 1 |  9.21 x.50 x6.14l,1.00 | File type: PDF | 167 pages

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The history of this book begins way back in 1982. At that time a research proposal was filed with the Dutch Foundation for Fundamental Research on Matter concerning research to model defects in the layer structure of integrated circuits. It was projected that the results may be useful for yield estimates, fault statistics and for the design of fault tolerant structures. The reviewers were not in favor of this proposal and it disappeared in the drawers. Shortly afterwards...

You easily download any file type for your gadget.Integrated Circuit Defect-Sensitivity: Theory and Computational Models (The Springer International Series in Engineering and Computer Science)   |  José Pineda de Gyvez. I was recommended this book by a dear friend of mine.

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